DocumentCode
754812
Title
Using Transfer-Resource Graph for Software-Based Verification of System-on-Chip
Author
Xu, Xiaoxi ; Lim, Cheng-Chew
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Adelaide, Adelaide, SA
Volume
27
Issue
7
fYear
2008
fDate
7/1/2008 12:00:00 AM
Firstpage
1315
Lastpage
1328
Abstract
The verification of system-on-chip is challenging due to its high level of integration. Multiple components in a system can behave concurrently and compete for resources. Hence, for simulation-based verification, we need a methodology that allows one to automatically generate test cases for testing concurrent and resource-competing behaviors. We introduce the use of a transfer-resource graph (TRG) as the model for test generation. From a high abstraction level, TRG is able to model the parallelism between heterogeneous interaction forms in a system. We show how TRG is used in generating test cases of resource competitions and how these test cases are structured in event-driven test programs. For coverage, TRG can be converted to a Petri net, allowing one to measure the completeness of concurrency in simulation.
Keywords
Petri nets; VLSI; electronic engineering computing; formal verification; integrated circuit testing; system-on-chip; Petri net; concurrency; event-driven test programs; resource-competing behaviors; software-based verification; system-on-chip; transfer-resource graph; Automatic testing; Circuit testing; Computer bugs; Concurrent computing; Discrete event simulation; Helium; Large scale integration; System testing; System-on-a-chip; Very large scale integration; Concurrency; coverage; event-driven; resource-contention; simulation; system-on-chip; test-generation; verification;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2008.923092
Filename
4544870
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