• DocumentCode
    759064
  • Title

    Improvements on the duality based method used in solving optimal power flow problems

  • Author

    Lin, Ch´i-hsin ; Lin, Shin-Yeu ; Lin, Shieh-Shing

  • Author_Institution
    Dept. of Electron. Eng., KaoYuan Inst. of Technol., Kaoshiung, Taiwan
  • Volume
    17
  • Issue
    2
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    315
  • Lastpage
    323
  • Abstract
    To improve the previously developed dual-type (DT) method used in solving optimal power flow (OPF) problems with large number of thermal-limit constraints, the authors propose two new techniques in this paper. The first one is a graph-method based decomposition technique which can decompose the large-dimension projection problem, caused by the large number of thermal-limit constraints, into several independent medium-dimension projection subproblems at the expense of slight increment of the dual problem´s dimension. The second technique is an active-set strategy based DT method which can solve the medium-dimension projection subproblems efficiently. They have used the DT method embedded with these two new techniques in solving numerous OPFs with large number of thermal-limit constraints. The test results show that the proposed techniques are very efficient and effectively improve the DT method for handling large number of thermal-limit constraints
  • Keywords
    control system synthesis; duality (mathematics); graph theory; load flow; nonlinear programming; optimal control; power system control; active-set strategy; control design; decomposition technique; duality based solution method; graph-method; medium-dimension projection subproblems; nonlinear programming; optimal power flow; power systems; thermal-limit constraints; Control engineering; Equations; History; Load flow; Numerical stability; Power system stability; Quadratic programming; Testing; Thermal decomposition; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2002.1007898
  • Filename
    1007898