• DocumentCode
    760682
  • Title

    Frequency analysis of the induced effects due to the lightning stroke radiated electromagnetic field

  • Author

    Buccella, Condettina ; Cristina, Saverio ; Orlandi, Antonio

  • Author_Institution
    Dept. of Electr. Eng., L´´Aquila Univ., Italy
  • Volume
    34
  • Issue
    3
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    338
  • Lastpage
    344
  • Abstract
    The effects of a lightning stroke to the protection system of the control building of an industrial plant are investigated. The results of a frequency-analysis study of effects connected with point values of the electromagnetic field generated within the building or due to the presence of radiation fields, namely, fields whose harmonic components, characterized by small wavelengths compared to the dimensions of the `victim´ circuit, assume nonnegligible values, are reported. These effects are calculated using a procedure based on a field approach. Characterization of the electromagnetic field is ensured by a numerical procedure that permits simultaneous simulation of the protection system and analysis of the electromagnetic field by means of the method of moments used by various authors for the study of direct lightning strokes to thin-wire structures. Two distinct points of impact of the lightning stroke to the protection system are considered, and the results are compared
  • Keywords
    frequency-domain analysis; lightning protection; control building; frequency domain analysis; induced effects; industrial plant; lightning protection system; lightning stroke; method of moments; numerical procedure; protection system; radiated electromagnetic field; simulation; thin-wire structures; Character generation; Circuits; Control systems; Electromagnetic fields; Electromagnetic radiation; Frequency; Industrial plants; Lighting control; Lightning; Protection;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.155850
  • Filename
    155850