Performance of dual selection combiners over correlated Nakagami-m fading with different fading parameters

This letter presents infinite series expressions for the outage probability, the probability density function, the average error probability for binary modulations, and the average signal-to-noise ratio of dual selection combiners over correlated fading with arbitrary fading parameters at each input of the combiner. The outage probability is calculated for both thermal noise and interference-limited scenarios. The results obtained for the outage probabilities specified for identical fading parameters at both branches of the combiner are contrasted with the results of other studies in the literature