• DocumentCode
    763990
  • Title

    Weibull accelerated life testing with unreported early failures

  • Author

    Glaser, R.E.

  • Author_Institution
    Div. of Eng. Res., Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    44
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    Situations arise in life testing where early failures go unreported, e.g. a technician believes an early failure is “his fault” or “premature” and must not be recorded. Consequently, the reported data come from a truncated distribution and the number of unreported early failures is unknown. Inferences are developed for a Weibull accelerated life-testing model in which transformed scale and shape parameters are expressed as linear combinations of functions of the environment (stress). Coefficients of these combinations are estimated by maximum likelihood methods which allow point, interval, and confidence bound estimates to be computed for such quantities of interest for a given stress level as the shape parameter, the scale parameter, a selected quantile, the reliability at a particular time, and the number of unreported early failures. The methodology allows lifetimes to be reported as exact, right censored, or interval-valued, and to be subject optionally to testing protocols which establish thresholds below which lifetimes go unreported. A broad spectrum of applicability is anticipated by virtue of the substantial generality accommodated in both stress modeling and data type
  • Keywords
    Weibull distribution; life testing; maximum likelihood estimation; reliability theory; Weibull accelerated life testing; confidence bound estimates; early failures; exact lifetime; interval estimates; interval-valued lifetime; maximum likelihood methods; point estimates; right censored lifetime; scale parameter; shape parameter; stress functions; stress modeling; testing protocols; unreported early failures; Extraterrestrial measurements; Laboratories; Life estimation; Life testing; Lifetime estimation; Maximum likelihood estimation; Protocols; Shape measurement; Statistical analysis; Stress;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.376518
  • Filename
    376518