DocumentCode
764854
Title
Experimental study on close-in to microwave carrier phase noise of laser diode with external feedback
Author
Ni, Tsang-Der ; Zhang, Xiangdong ; Daryoush, Afshin S.
Author_Institution
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Volume
43
Issue
9
fYear
1995
fDate
9/1/1995 12:00:00 AM
Firstpage
2277
Lastpage
2283
Abstract
The residual phase noise at close-in to carrier offset frequency is studied for optical links using a laser diode with an external optical feedback. Since the measured FM noise degradation of the modulating signal was found to be insignificantly higher than the expected 20log (n) in dB, the residual phase noise of the laser diode was measured to quantify the expected carrier signal FM noise floor level. The measured residual phase noise of a InGaAsP laser diode at 1 KHz offset carrier signal of 5.08 GHz is measured to be -100 and -90 dBc/Hz with and without a 3-cm-long free-space external cavity, respectively. The close-in to carrier phase noise results of this laser at the external cavity resonance frequency of ≈5 GHz is explained for the first time in terms of laser diode nonlinearity and FM noise theory of injection locked microwave oscillators. A good match between the predicted and measured results was observed
Keywords
laser cavity resonators; laser feedback; optical fibre communication; optical fibres; optical links; optical modulation; phase noise; semiconductor lasers; 5.08 GHz; FM noise degradation; FM noise theory; InGaAsP; carrier offset frequency; directly-modulated links; external cavity resonance frequency; external optical feedback; free-space external cavity; laser diode; laser diode nonlinearity; modulating signal; noise floor level; optical fibres; optical links; residual phase noise; Degradation; Diode lasers; Frequency modulation; Noise level; Noise measurement; Optical feedback; Optical fiber communication; Optical noise; Phase measurement; Phase noise;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.414576
Filename
414576
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