• DocumentCode
    764871
  • Title

    Effect of Localized Stress on Power Loss in (110) [001] Si-Fe with Law Thickness

  • Author

    Takeda, K. ; Ueda, F. ; Yamaguchi, T.

  • Author_Institution
    Fukuoka Institute of Technology.
  • Volume
    1
  • Issue
    4
  • fYear
    1985
  • fDate
    7/1/1985 12:00:00 AM
  • Firstpage
    473
  • Lastpage
    475
  • Abstract
    Investigations of the conditions for low losses in ultra-thin grain-oriented silicon steel sheets are described. The eddy current loss was found to be very large when the angle of inclination of the [001] axis against the sheet surface was 3° or less. The effect of scribe processes on 0.1 mm sheets was studied, by performing scribing on 3 percent Si-Fe single-layer sheets while varying the scribe load and spacing. Saturation of loss reduction was thought to occur for a load of 90 g at a spacing of 2.5 mm or less. Scribing had an effect when large spacings and large loads, or when small spacings and small loads, were used.
  • Keywords
    Annealing; Building materials; Eddy currents; Magnetic domains; Magnetics Society; Sheet materials; Silicon; Steel; Stress; Transformer cores;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1985.4548827
  • Filename
    4548827