DocumentCode
766332
Title
Amplitude and time measurement ASIC with analog derandomization: first results
Author
Connor, Paul O. ; De Geronimo, Gianluigi ; Kandasamy, Anand
Author_Institution
Brookhaven Nat. Lab., Upton, NY, USA
Volume
50
Issue
4
fYear
2003
Firstpage
892
Lastpage
897
Abstract
We describe a new amplitude specific integrated circuit (ASIC) for accurate and efficient processing of high-rate pulse signals from highly segmented detectors. In contrast to conventional approaches, this circuit affords a dramatic reduction in data volume through the use of analog techniques (precision peak detectors and time-to-amplitude converters) together with fast arbitration and sequencing logic to concentrate the data before digitization. In operation the circuit functions like a data-driven analog first-in, first-out (FIFO) memory between the preamplifiers and the analog-to-digital converter (ADC). Peak amplitudes of pulses arriving at any one of the 32 inputs are sampled, stored, and queued for readout and digitization through a single output port. Hit timing, pulse risetime, and channel address are also available at the output. Prototype chips have been fabricated in 0.35 micron CMOS and tested. First results indicate proper functionality for pulses down to 30 ns peaking time and random input rates up to 1.6 MHz on a single channel. Amplitude accuracy of the peak detect and hold circuit is 0.3% (absolute). TAC accuracy is within 0.3% of full scale. Power consumption is less than 2 mW/channel at the maximum counting rate. Compared with conventional techniques such as track-and-hold and analog memory, this new ASIC will enable efficient pulse height measurement at 20 to 300 times higher rates.
Keywords
CMOS integrated circuits; analogue storage; analogue-digital conversion; application specific integrated circuits; nuclear electronics; 0.35 micron; ASIC; CMOS; amplitude specific integrated circuit; analog techniques; data-driven analog first-in first-out memory; derandomizer; digitization; high-rate pulse signals; highly segmented detectors; precision peak detectors; readout; time-to-amplitude converters; Analog-digital conversion; Application specific integrated circuits; Detectors; Logic circuits; Preamplifiers; Pulse circuits; Pulse measurements; Signal processing; Time measurement; Timing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2003.814541
Filename
1221893
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