SMILETRAP-a wide-range high-precision mass spectrometer

Author

Carlberg, C. ; Bergstrom, Ilias ; Bollen, G. ; Borgenstrand, H. ; Jertz, R. ; Kluge, H.-J. ; Rouleau, G. ; Schuch, R. ; Schwarz, T. ; Schweikhard, L. ; Senne, P. ; Soderberg, F.

Author_Institution

Dept. of Atomic Phys., Stockholm Univ., Sweden

Volume

44

Issue

2

fYear

1995

fDate

4/1/1995 12:00:00 AM

Firstpage

553

Lastpage

557

Abstract

The capture of externally produced highly charged ions in a Penning trap and the observation of their cyclotron frequencies is described. The ions were produced in an electron beam ion source at a 2.8 kV potential. Injection was made possible by a pretrap, in which these ions were first captured at 2.8 kV and then lowered down to ground potential which allowed transfer (at 1 kV) and capture in the measurement trap at 0 V, The first mass comparisons were made between different charge states of the same nuclei, that is, O⁸⁺/O ⁷⁺, Ar¹⁴⁺/Ar¹³⁺,and Ar¹⁷⁺/Ar ¹⁶⁺. Comparison s between different nuclei, Ar^{13+,14+,15+,16+}/H₂²⁺, were also made. First tests of accuracy indicates uncertainties smaller than 10^-8

Keywords

Penning ion sources; Penning ionisation; argon; hydrogen ions; ion sources; mass measurement; mass spectra; mass spectrometer accessories; mass spectroscopy; oxygen; particle traps; positive ions; 0 V; 1 kV; 2.8 kV; Ar; Ar-H₂; Ar^{13+,14+,15+,16+}/H₂²⁺; Ar¹⁴⁺/Ar¹³⁺; Ar¹⁷⁺/Ar¹⁶⁺; O; O⁸⁺/O⁷⁺; Penning trap; SMILETRAP; charge states; cyclotron frequencies; electron beam ion source; high-precision mass spectrometer; highly charged ions; mass comparison; multiply charged ions; pretrap; uncertainties; Argon; Charge measurement; Current measurement; Cyclotrons; Electron beams; Electron traps; Frequency; Ion sources; Mass spectroscopy; Nuclear measurements;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.377905

Filename

377905