Investigation of single event upset subject to protons of intermediate energy range [RAM]

Author

Takami, Y. ; Shiraishi, F. ; Goka, T. ; Shimano, Y. ; Sekiguchi, M. ; Shida, K. ; Kishida, N. ; Kadotani, H. ; Kikuchi, T. ; Hoshino, N. ; Murakami, S. ; Anayama, H. ; Morio, A.

Author_Institution

Inst. for Atomic Energy, Rikkyo Univ., Kanagawa, Japan

Volume

37

Issue

6

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

1953

Lastpage

1960

Abstract

Nuclear reaction models to reproduce p+Si nuclear reactions precisely in the incident proton energy region of below 50 MeV are investigated, and a computer code based on exciton models is developed. Si irradiation experiments in the intermediate energy region were performed to measure energy deposited by p+Si nuclear reactions with two totally depleted Si detectors in face-to-face arrangement. Coincident signals were analyzed by a two-dimensional pulse height analyzer. This method is shown to be effective in discriminating signals of contaminating particles. The experimental observations are in good agreement with the computed predictions. The single-event upset (SEU) cross section of the 93L422 (RAM) is also compared with the calculated values

Keywords

cosmic ray protons; integrated circuit testing; proton effects; random-access storage; 10 to 40 MeV; 93L422; Earth radiation belt; RAM; SEU cross section; coincident signals; computer code; energy deposition; exciton models; incident proton energy region; intermediate energy range; nuclear reaction model; proton irradiation; single event upset; totally depleted Si detectors; two-dimensional pulse height analyzer; Detectors; Energy measurement; Excitons; Face detection; Nuclear measurements; Performance evaluation; Pollution measurement; Protons; Signal analysis; Single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.101214

Filename

101214