• DocumentCode
    768904
  • Title

    Mounting of high power laser diodes on diamond heatsinks

  • Author

    Weiss, Steven ; Zakel, Eke ; Reichl, Herbert

  • Author_Institution
    Centre of Microperipheric Technols., Tech. Univ. Berlin, Germany
  • Volume
    19
  • Issue
    1
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    46
  • Lastpage
    53
  • Abstract
    This work describes the mounting of commercial 1 W laser diodes soldered on chemical vapor deposition (CVD) diamond heatsinks using Au(80)Sn(20)-solder. With a standard heatsink metallization, the laser diode suffers under high stress. This can be seen in the power-current characteristic and the spectrum as well as in the near and farfield beam pattern, With a modification of the heatsink metallization layer, it was possible to obtain a reproducible mounting process. We compare the electrical and optical characterization of the typical standard heatsink metallization with the modified metallization. So we are able to qualify the mechanical stress in the laser diode. For a better understanding of the modified metallization SEM and EDX analyses are performed. For the quantification of the stress an analytical model is used to compute the maximal shear, tensile, and peel stress. Furthermore, the quality of the bond interface is investigated with high resolution X-ray microscopy. No voids are found. Additionally, the results of a standard burn-in and the first accelerated aging tests to prove the reliability are presented
  • Keywords
    diamond; heat sinks; optical fabrication; semiconductor device metallisation; semiconductor lasers; soldering; thermal stresses; 1 W; Au(80)Sn(20)-solder; Au80Sn20; CVD diamond heatsink; EDX; SEM; X-ray microscopy; accelerated aging testing; bond interface; burn-in; farfield beam pattern; high power laser diode; mechanical stress; metallization; mounting; nearfield beam pattern; peel stress; power-current characteristics; reliability; shear stress; tensile stress; Analytical models; Bonding; Chemical vapor deposition; Diode lasers; Heat sinks; Laser beams; Metallization; Performance analysis; Scanning electron microscopy; Tensile stress;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.486562
  • Filename
    486562