DocumentCode
768904
Title
Mounting of high power laser diodes on diamond heatsinks
Author
Weiss, Steven ; Zakel, Eke ; Reichl, Herbert
Author_Institution
Centre of Microperipheric Technols., Tech. Univ. Berlin, Germany
Volume
19
Issue
1
fYear
1996
fDate
3/1/1996 12:00:00 AM
Firstpage
46
Lastpage
53
Abstract
This work describes the mounting of commercial 1 W laser diodes soldered on chemical vapor deposition (CVD) diamond heatsinks using Au(80)Sn(20)-solder. With a standard heatsink metallization, the laser diode suffers under high stress. This can be seen in the power-current characteristic and the spectrum as well as in the near and farfield beam pattern, With a modification of the heatsink metallization layer, it was possible to obtain a reproducible mounting process. We compare the electrical and optical characterization of the typical standard heatsink metallization with the modified metallization. So we are able to qualify the mechanical stress in the laser diode. For a better understanding of the modified metallization SEM and EDX analyses are performed. For the quantification of the stress an analytical model is used to compute the maximal shear, tensile, and peel stress. Furthermore, the quality of the bond interface is investigated with high resolution X-ray microscopy. No voids are found. Additionally, the results of a standard burn-in and the first accelerated aging tests to prove the reliability are presented
Keywords
diamond; heat sinks; optical fabrication; semiconductor device metallisation; semiconductor lasers; soldering; thermal stresses; 1 W; Au(80)Sn(20)-solder; Au80Sn20; CVD diamond heatsink; EDX; SEM; X-ray microscopy; accelerated aging testing; bond interface; burn-in; farfield beam pattern; high power laser diode; mechanical stress; metallization; mounting; nearfield beam pattern; peel stress; power-current characteristics; reliability; shear stress; tensile stress; Analytical models; Bonding; Chemical vapor deposition; Diode lasers; Heat sinks; Laser beams; Metallization; Performance analysis; Scanning electron microscopy; Tensile stress;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher
ieee
ISSN
1070-9886
Type
jour
DOI
10.1109/95.486562
Filename
486562
Link To Document