DocumentCode
772583
Title
Charge-injection noise in CCDs
Author
Kern, Brian
Author_Institution
California Inst. of Technol., Pasadena, CA
Volume
53
Issue
10
fYear
2006
Firstpage
2478
Lastpage
2484
Abstract
An analysis of the noise associated with electronic charge injection in charge-coupled devices (CCDs) is presented, including the effects of diffusion currents. The capacitance of the injection circuit determines the charge-injection noise, and specification of the noise requires consideration of the quoted capacitance; for large charge packets, the noise has a characteristic variance of kTC/2 or kTC, depending on whether the capacitance is defined by microscopic (internal) or macroscopic (external) potentials. The variance is Poissonian for small charge packets. The noise values presented in this paper may serve as a target when optimizing charge-injection operation of a CCD
Keywords
capacitance; charge injection; charge-coupled devices; semiconductor device models; semiconductor device noise; capacitance; charge injection noise; charge-coupled devices; diffusion currents effects; Acoustic noise; Capacitance; Charge coupled devices; Circuit noise; Consumer electronics; Degradation; Diodes; Energy resolution; Noise level; X-ray imaging; Charge-coupled devices (CCDs); MOSFETs; diffusion processes; shot noise;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2006.882271
Filename
1705098
Link To Document