• DocumentCode
    772583
  • Title

    Charge-injection noise in CCDs

  • Author

    Kern, Brian

  • Author_Institution
    California Inst. of Technol., Pasadena, CA
  • Volume
    53
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2478
  • Lastpage
    2484
  • Abstract
    An analysis of the noise associated with electronic charge injection in charge-coupled devices (CCDs) is presented, including the effects of diffusion currents. The capacitance of the injection circuit determines the charge-injection noise, and specification of the noise requires consideration of the quoted capacitance; for large charge packets, the noise has a characteristic variance of kTC/2 or kTC, depending on whether the capacitance is defined by microscopic (internal) or macroscopic (external) potentials. The variance is Poissonian for small charge packets. The noise values presented in this paper may serve as a target when optimizing charge-injection operation of a CCD
  • Keywords
    capacitance; charge injection; charge-coupled devices; semiconductor device models; semiconductor device noise; capacitance; charge injection noise; charge-coupled devices; diffusion currents effects; Acoustic noise; Capacitance; Charge coupled devices; Circuit noise; Consumer electronics; Degradation; Diodes; Energy resolution; Noise level; X-ray imaging; Charge-coupled devices (CCDs); MOSFETs; diffusion processes; shot noise;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.882271
  • Filename
    1705098