• DocumentCode
    772728
  • Title

    Power dependence of distributed cavity phase-induced frequency biases in atomic fountain frequency standards

  • Author

    Jefferts, Steven R. ; Shirley, Jon H. ; Ashby, Neil ; Burt, Eric A. ; Dick, G. John

  • Author_Institution
    Time & Frequency Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    52
  • Issue
    12
  • fYear
    2005
  • Firstpage
    2314
  • Lastpage
    2321
  • Abstract
    We discuss the implications of using high-power microwave tests in a fountain frequency standard to measure the frequency bias resulting from distributed cavity-phase shifts. We develop a theory which shows that the frequency bias from distributed cavity phase depends on the amplitude of the microwave field within the cavity. The dependence leads to the conclusion that the frequency bias associated with the distributed cavity phase is typically both misestimated and counted twice within the error budget of fountain frequency standards.
  • Keywords
    cavity resonators; frequency standards; hyperfine structure; atomic fountain frequency standards; distributed cavity frequency biases; distributed cavity-phase shifts; error budget; frequency bias; high-power microwave tests; hyperfine frequency; microwave field amplitude; phase-induced frequency biases; power dependence; Atomic measurements; Equations; Frequency estimation; Frequency measurement; Laser beams; Measurement standards; NIST; Propulsion; Space technology; Testing;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2005.1563276
  • Filename
    1563276