MMIC-calibrated probing by CW electrooptic modulation

Author

Le Quang, D. ; Erasme, Didier ; Huyart, Bernard

Author_Institution

Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France

Volume

43

Issue

5

fYear

1995

fDate

5/1/1995 12:00:00 AM

Firstpage

1031

Lastpage

1036

Abstract

This paper describes an electrooptic probing technique using a CW semiconductor-laser beam associated with a fast photodetector. Besides its simplicity, this technique presents some advantages over the sampling one thanks to the presence of a Fabry-Perot effect, namely an enhancement of the electrooptic interaction and a simple solution to the calibration problem. The good validity of the calibration method allows the application of this technique to S-parameter measurements. The S-parameter determination, in modulus and in phase, of an industrial MMIC by the electrooptic method is reported and compared with direct network analyzer measurements

Keywords

MMIC; S-parameters; calibration; electro-optical modulation; integrated circuit measurement; integrated circuit testing; measurement by laser beam; probes; CW electrooptic modulation; CW semiconductor-laser beam; Fabry-Perot effect; MMIC-calibrated probing; S-parameter determination; S-parameter measurements; calibration problem; electrooptic interaction; fast photodetector; industrial MMIC; network analyzer measurements; Calibration; Circuit testing; Electrooptic modulators; Fabry-Perot; Gallium arsenide; Laser beams; Optical beams; Optical refraction; Photodetectors; Scattering parameters;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.382062

Filename

382062