DocumentCode
773760
Title
Modification of surface energy, dry etching, and organic film removal using atmospheric-pressure pulsed-corona plasma
Author
Yamamoto, Toshiaki ; Newsome, J. Raandall ; Ensor, David S.
Author_Institution
Res. Triangle Inst., Research Triangle Park, NC, USA
Volume
31
Issue
3
fYear
1995
Firstpage
494
Lastpage
499
Abstract
A laboratory-scale atmospheric-pressure plasma reactor, using a nanosecond pulsed corona, was constructed to demonstrate potential applications ranging from modification of surface energy to removal of surface organic films. For surface modification studies, three different substrates were selected to evaluate the surface energies: bare aluminum, polyurethane, and silicon coated with photoresist. The critical surface energy for all materials studied significantly increased after the plasma treatment. The effects of gas composition and plasma treatment time were also investigated. Photoresist, ethylene glycol, and Micro surfactant were used as test organic films. The etching rate of a photoresist coating on silicon was 9 nm/min. Organic film removal using atmospheric pressure plasma technology was shown to be feasible
Keywords
corona; etching; organic compounds; photoresists; surface energy; surface energy measurement; surface treatment; Al; Micro surfactant; Si; atmospheric-pressure pulsed-corona plasma; bare aluminum; dry etching; ethylene glycol; gas composition; nanosecond pulsed corona; organic film removal; photoresist; plasma treatment; polyurethane; silicon; substrates; surface energy modification; Atmospheric-pressure plasmas; Corona; Dry etching; Inductors; Laboratories; Plasma applications; Plasma materials processing; Resists; Silicon; Surface treatment;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/28.382108
Filename
382108
Link To Document