DocumentCode
776969
Title
Optical Diagnostics of Semiconductors
Author
Fouquet, J.E. ; Merz, J.L.
Volume
1
Issue
4
fYear
1995
Firstpage
977
Keywords
Optical films; Optical interferometry; Optical refraction; Optical scattering; Optical sensors; Optical variables control; Production; Semiconductor devices; Surface emitting lasers; Vertical cavity surface emitting lasers;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.1995.488394
Filename
488394
Link To Document