• DocumentCode
    778845
  • Title

    Temperature dependence of the permittivity and loss tangent of high-permittivity materials at terahertz frequencies

  • Author

    Berdel, Klaus ; Rivas, Jaime Gémez ; Bolívar, Peter Haring ; De Maagt, Peter ; Kurz, Heinrich

  • Author_Institution
    Inst. fur Halbleitertechnik, Rheinisch Westfaelische Tech. Hochschule Aachen, Germany
  • Volume
    53
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    1266
  • Lastpage
    1271
  • Abstract
    An analysis including the temperature dependence of the permittivity and loss tangent of three low-cost and high-permittivity materials (zirconium-tin-titanate, alumina, and titanium-dioxide) in the terahertz frequency range is presented. Such dielectric materials find varied applications in microwave and terahertz systems and components. Their effective use under varying environmental conditions or in space applications requires a detailed knowledge about temperature dependencies. Here, measurements using broad-band terahertz time-domain spectroscopy are presented in the temperature range from 10 to 323 K. It is shown that zirconium-tin-titanate and alumina provide a good thermal stability of the permittivity, whereas the permittivity of titanium-dioxide exhibits a strong dependence on the temperature.
  • Keywords
    ceramics; dielectric materials; permittivity; submillimetre wave spectroscopy; temperature; time-domain analysis; titanium compounds; 10 to 323 K; alumina; ceramics; dielectric materials; dielectric thermal factors; high-permittivity materials; loss tangent; microwave system; permittivity; submillimeter waves; terahertz frequencies; terahertz system; thermal stability; time-domain spectroscopy; titanium compounds; titanium-dioxide; zirconium-tin-titanate; Dielectric materials; Dielectric measurements; Frequency; Permittivity measurement; Spectroscopy; Submillimeter wave measurements; Temperature dependence; Temperature distribution; Thermal stability; Time domain analysis; Ceramics; dielectric materials; dielectric thermal factors; measurement; submillimeter waves; titanium compounds;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.845752
  • Filename
    1420756