DocumentCode
778845
Title
Temperature dependence of the permittivity and loss tangent of high-permittivity materials at terahertz frequencies
Author
Berdel, Klaus ; Rivas, Jaime Gémez ; Bolívar, Peter Haring ; De Maagt, Peter ; Kurz, Heinrich
Author_Institution
Inst. fur Halbleitertechnik, Rheinisch Westfaelische Tech. Hochschule Aachen, Germany
Volume
53
Issue
4
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
1266
Lastpage
1271
Abstract
An analysis including the temperature dependence of the permittivity and loss tangent of three low-cost and high-permittivity materials (zirconium-tin-titanate, alumina, and titanium-dioxide) in the terahertz frequency range is presented. Such dielectric materials find varied applications in microwave and terahertz systems and components. Their effective use under varying environmental conditions or in space applications requires a detailed knowledge about temperature dependencies. Here, measurements using broad-band terahertz time-domain spectroscopy are presented in the temperature range from 10 to 323 K. It is shown that zirconium-tin-titanate and alumina provide a good thermal stability of the permittivity, whereas the permittivity of titanium-dioxide exhibits a strong dependence on the temperature.
Keywords
ceramics; dielectric materials; permittivity; submillimetre wave spectroscopy; temperature; time-domain analysis; titanium compounds; 10 to 323 K; alumina; ceramics; dielectric materials; dielectric thermal factors; high-permittivity materials; loss tangent; microwave system; permittivity; submillimeter waves; terahertz frequencies; terahertz system; thermal stability; time-domain spectroscopy; titanium compounds; titanium-dioxide; zirconium-tin-titanate; Dielectric materials; Dielectric measurements; Frequency; Permittivity measurement; Spectroscopy; Submillimeter wave measurements; Temperature dependence; Temperature distribution; Thermal stability; Time domain analysis; Ceramics; dielectric materials; dielectric thermal factors; measurement; submillimeter waves; titanium compounds;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2005.845752
Filename
1420756
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