• DocumentCode
    779892
  • Title

    Guest Editor´s Introduction: Reliability-Aware Microarchitecture

  • Author

    Adve, Sarita V. ; Sanda, Pia

  • Author_Institution
    University of Illinois at Urbana-Champaign
  • Volume
    25
  • Issue
    6
  • fYear
    2005
  • Firstpage
    8
  • Lastpage
    9
  • Abstract
    This special issue of IEEE Micro addresses the trends toward reliability-aware microarchitecture, their system-level implications, and some innovative ideas on how to build systems in the face of those challenges.
  • Keywords
    CMOS scaling; Reliability-aware microarchitecture; reliability management; soft errors; CMOS logic circuits; Costs; Degradation; Hardware; Logic devices; Microarchitecture; Operating systems; Redundancy; Temperature; Timing; CMOS scaling; Reliability-aware microarchitecture; reliability management; soft errors;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2005.112
  • Filename
    1566550
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=779892