• DocumentCode
    784998
  • Title

    Measurements of Complex Permittivity at Millimeter-Wave Frequencies With an End-Loaded Cavity Resonator

  • Author

    Yoshikawa, Hiromichi ; Nakayama, Akira

  • Author_Institution
    Corp. R&D Center, Kyocera Corp., Kirishima
  • Volume
    56
  • Issue
    8
  • fYear
    2008
  • Firstpage
    2001
  • Lastpage
    2007
  • Abstract
    A novel cavity resonator method is proposed for measuring the complex permittivity of a dielectric plate in the millimeter-wave region. In this method, the dielectric plate is loaded at the end of the cavity resonator. The relative permittivity epsiv´ and loss tangent delta are determined from measured resonant frequency and unloaded Q of the TE011 mode. This structure prevents excessive lowering of the resonant frequency due to the placement of the dielectric plate sample in the cavity. The suppression of spurious modes and the design of the cavity resonator are discussed. The values of epsiv´ and tandelta were measured in the millimeter-wave range for low-temperature co-fired ceramic (LTCC), Al2O3 , and sapphire plates. The temperature dependence of the complex permittivity of the LTCC plate was measured at 34 GHz. The measurement accuracies are estimated to be within 0.6% for epsiv´, and within 10% for of 10-3.
  • Keywords
    cavity resonators; millimetre wave devices; permittivity; complex permittivity; dielectric plate; end-loaded cavity resonator; loss tangent; millimeter-wave frequencies; relative permittivity; resonant frequency; Cavity resonator; complex permittivity; dielectric property; measurement method; millimeter wave;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.927410
  • Filename
    4560054