• DocumentCode
    786035
  • Title

    A physical compact model of DG MOSFET for mixed-signal circuit applications - part II: Parameter extraction

  • Author

    Pei, Gen ; Kan, Edwin Chih-Chuan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    50
  • Issue
    10
  • fYear
    2003
  • Firstpage
    2144
  • Lastpage
    2153
  • Abstract
    For pt. see ibid., vol. 50, no. 10, p. 2135 (2003). Based on the physical double-gate MOSFET model described in Part I, we present a systematic parameter extraction methodology that avoids parameter interdependence between different physical effects whenever possible. Several extraction schemes are compared for precise modeling of small-signal and large-signal characteristics. The physical model and the extraction methodology are verified through the reproduction of the simulated drain current, incremental drain resistance, and transconductance per unit current, which are parameters of particular interest to mixed-signal circuit designs.
  • Keywords
    MOSFET; carrier mobility; parameter estimation; semiconductor device models; DG MOSFET; incremental drain resistance; large-signal characteristics; mixed-signal circuit applications; physical compact model; physical effects; precise modeling; simulated drain current; small-signal characteristics; systematic parameter extraction methodology; transconductance; Circuit simulation; Circuit synthesis; Doping; MOSFET circuits; Parameter extraction; Semiconductor process modeling; Solid modeling; Temperature; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2003.817480
  • Filename
    1232935