• DocumentCode
    786110
  • Title

    Thermal Aging

  • Author

    Kaneko, T.

  • Author_Institution
    Japan Electrical Testing Laboratory Yoyogi Shibuya-ku Tokyo, Japan
  • Issue
    6
  • fYear
    1986
  • Firstpage
    907
  • Lastpage
    911
  • Abstract
    In Japan, study on thermal aging of insulating materials and investigation of testing methods for thermal endurance were begun by T. Akahira´s pioneering theoretical and experimental work in 1925. From 1957, Y. Saito and his co-workers had published papers describing a short-time testing method for thermal endurance by mass spectrometry. A new theory and method for analyzing thermal analysis were founded by T. Akahira and T. Sunose, while another theory and method were set forth by T. Ozawa. These theories, which are applied to results obtained under changing temperature conditions, have contributed comparison of test results obtained at different temperatures by conventional testing method and also to analyze the aging phenomena under changing temperature that is near to actual conditions. In general, thermal aging is affected by concentrations of oxygen and products in the reaction region. Therefore, there are attempts to elucidate diffusion phenomena in aging reactions. These studies have been progressing by mutual influence, and will do so in the future.
  • Keywords
    Accelerated aging; Dielectrics and electrical insulation; Electrical products; Laboratories; Lamps; Mass spectroscopy; Materials testing; Power supplies; Production; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1986.349000
  • Filename
    4157086