DocumentCode
786777
Title
Visual inspection in industrial manufacturing
Author
König, Andreas ; Windirsch, Peter ; Gasteier, Michael ; Glesner, Manfred
Author_Institution
Inst. for Microelectron. Syst., Darmstadt Univ. of Technol., Germany
Volume
15
Issue
3
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
26
Lastpage
31
Abstract
Visual quality control is a demanding task of increasing importance in industrial manufacturing. Both speed and flexibility are of paramount importance for viable and competitive inspection systems. We have developed a dedicated neural network architecture for anomaly detection that can easily be trained by a single presentation of examples and is amenable to massively parallel VLSI implementation. We focus here on our ASIC and prototype system design effort for this network
Keywords
associative processing; automatic optical inspection; manufacturing industries; neural nets; quality control; ASIC; anomaly detection; industrial manufacturing; inspection systems; massively parallel VLSI implementation; neural network architecture; visual inspection; visual quality control; Electrical equipment industry; Fault detection; Gas industry; Inspection; Manufacturing industries; Neural networks; Neurons; Pixel; Prototypes; Quality control;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/40.387679
Filename
387679
Link To Document