• DocumentCode
    787688
  • Title

    Response of Lithium-Drifted Silicon Radiation Detectors to High Energy Charged Particies

  • Author

    Aitken, D.W. ; Emerson, D.W. ; Zulliger, H.R.

  • Author_Institution
    Department of Physics and High Energy Physics Laboratory Stanford University, Stanford, California
  • Volume
    15
  • Issue
    1
  • fYear
    1968
  • Firstpage
    456
  • Lastpage
    465
  • Abstract
    The measured response characteristics of lithium-drifted silicon radiation detectors at 295°K and 79°K are presented for protons with energies from 315 to 3.5 MeV; for positive pions with energies from 50.2 to 206 MeV; and for electrons with energies from 265 keV to 767.2 MeV. Analysis of the energy loss spectra confirms that the energy is being deposited by the protons and pions in the silicon purely through collision losses, whereas it appears that the silicon absorbs additional energy lost by the high energy electrons through interaction of the bremsstrahlung radiation in the depletion region. The charge collection efficiency determined by gamma rays is shown to agree with the charge collection efficiency determined by minimum ionizing particles. Nonlinear effects caused by unequal electron and hole trapping lengths and surface effects lead to reduced charge collection efficiencies for low energy electrons which do not completely penetrate the detector depletion region, in agreement with theory and with observations in the X-ray region. Apparent recombination effects also lead to reduced charge collection efficiencies at low fields or for protons with energies below about 100 MeV under constant bias conditions. The present data support the conclusion that the charge conversion factor ¿ at any one temperature is constant to within 1% for electrons, pions and protons over the entire energy span measured.
  • Keywords
    Charge carrier processes; Electron traps; Energy loss; Energy measurement; Gamma rays; Mesons; Protons; Silicon radiation detectors; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1968.4324887
  • Filename
    4324887