DocumentCode
788853
Title
Exchange anisotropy in PtMn/Ni80Fe20(110) quad-crystal films
Author
Yu, Chin Chung ; Huang, Jung Chun Andrew ; Der Yao, Yeong
Author_Institution
Inst. of Phys., Acad. Sinica, Taiwan, Taiwan
Volume
39
Issue
5
fYear
2003
Firstpage
2741
Lastpage
2743
Abstract
Exchange anisotropy for an ordered tetragonal PtMn/Ni80Fe20(110) quad-crystal film grown on an Mo(001) step surface was studied. The PtMn/Ni80Fe20 bilayers grown at 300°C show a unidirectional exchange anisotropy with the easy axis parallel to the underlying Mo step-edge direction. The azimuthal distribution of the coercive fields displays a fourfold symmetry. The azimuthal distribution of the coercive fields can be explained by the fourfold crystalline-induced interfacial strain between Ni80Fe20 and Mo. The azimuthal distribution of the exchange fields was mainly attributed to the step-induced unidirectional anisotropy and the biquadratic coupling between antiferromagnetic-ferromagnetic interface.
Keywords
Permalloy; antiferromagnetic materials; coercive force; exchange interactions (electron); ferromagnetic materials; interface magnetism; magnetic anisotropy; magnetic thin films; manganese alloys; platinum alloys; Mo(001) step surface; PtMn-Ni80Fe20; antiferromagnetic-ferromagnetic interface; azimuthal distribution; bilayers; coercive fields; exchange anisotropy; fourfold symmetry; interfacial strain; ordered tetragonal quad-crystal film; step-induced unidirectional anisotropy; Anisotropic magnetoresistance; Capacitive sensors; Crystallization; Displays; Iron; Molecular beam epitaxial growth; Physics; Substrates; Temperature; X-ray diffraction;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2003.815585
Filename
1233203
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