• DocumentCode
    789011
  • Title

    Distortion in RF CMOS short-channel low-noise amplifiers

  • Author

    Baki, Rola A. ; Tsang, Tommy K K ; El-Gamal, Mourad N.

  • Author_Institution
    Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Canada
  • Volume
    54
  • Issue
    1
  • fYear
    2006
  • Firstpage
    46
  • Lastpage
    56
  • Abstract
    An approach to estimate the distortion in CMOS short-channel (e.g. 0.18-μm gate length) RF low-noise amplifiers (LNAs), based on Volterra´s series, is presented. Compact and accurate frequency-dependent closed-form expressions describing the effects of the different transistor parameters on harmonic distortion are derived. For the first time, the second-order distortion (HD2), in CMOS short-channel based LNAs, is studied. This is crucial for systems such as homodyne receivers. Equations describing third-order intermodulation distortion in RF LNAs are reported. The analytical analysis is verified through simulations and measured results of an 0.18-μm CMOS 5.8-GHz folded-cascode LNA prototype chip geared toward sub-1-V operation. It is shown that the distortion is independent of the gate-source capacitance Cgs of the MOS transistors, allowing an extra degree of freedom in the design of LNA circuits. Distortion-aware design guidelines for RF CMOS LNAs are provided throughout the paper.
  • Keywords
    CMOS analogue integrated circuits; MMIC amplifiers; Volterra series; field effect MMIC; harmonic distortion; intermodulation distortion; low noise amplifiers; 0.18 micron; 5.8 GHz; MOS transistors; RF CMOS low-noise amplifiers; Volterra series; distortion estimation; folded-cascode LNA prototype chip; frequency-dependent closed-form expressions; harmonic distortion; homodyne receivers; second-order distortion; short-channel low-noise amplifiers; third-order intermodulation distortion; Analytical models; Circuit simulation; Closed-form solution; Distortion measurement; Equations; Harmonic distortion; Intermodulation distortion; Low-noise amplifiers; Radio frequency; Semiconductor device measurement; Closed-form expressions; RF low-noise amplifier (LNA); Volterra series; intermodulation distortion; second-order distortion (HD2); short-channel CMOS; third-order harmonic distortion (HD3);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.860897
  • Filename
    1573795