• DocumentCode
    789377
  • Title

    Models for Predicting Transient Radiation Responses in Microcircuits

  • Author

    Bowman, W.C. ; Beezhold, W. ; Johnston, A.H.

  • Author_Institution
    The Boeing Company Seattle, Washington
  • Volume
    15
  • Issue
    6
  • fYear
    1968
  • Firstpage
    279
  • Lastpage
    284
  • Keywords
    Circuits; Conductivity measurement; Current measurement; Dielectric substrates; Electrical resistance measurement; Photoconductivity; Predictive models; Resistors; Sparks; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1968.4325058
  • Filename
    4325058