• DocumentCode
    789600
  • Title

    Linearity and Resolution of Semiconductor Radiation Detectors

  • Author

    Zulliger, H.R. ; Middleman, L.M. ; Aitken, D.W.

  • Author_Institution
    Department of Physics and High Energy Physics Laboratory Stanford University, Stanford, California
  • Volume
    16
  • Issue
    1
  • fYear
    1969
  • Firstpage
    47
  • Lastpage
    61
  • Abstract
    The energy linearity for Si(Li) and Ge(Li) has been measured and compared with theory. Good agreement was obtained for x-ray attenuation factors ¿md < 100 . The region of the germanium absorption edge was investigated and found to exhibit larger nonlinearities than predicted by the theory. The discrepancy is believed to be due to inefficient charge collection near the detector window leading to excessive fluctuations in the trapped charge. Calculations of the line broadening due to trapping have been shown to agree qualitatively with experimental values for the silicon detector. These calculations do not take into account any position dependent variation of the trapping factor, and must therefore be considered as the best attainable values. The disagreement between theory and experiment for the line broadening in Ge(Li) is particularly evident. The ¿ seems to be independent of energy in Si to less than 0.2% and in Ge to within at least 2% . Finally, the Fano factor in Si was found to be 0.154 +0.1 -0.2.
  • Keywords
    Charge carrier processes; Electromagnetic wave absorption; Electron mobility; Electron traps; Energy resolution; Gamma ray detection; Germanium; Linearity; Semiconductor radiation detectors; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1969.4325080
  • Filename
    4325080