DocumentCode
789600
Title
Linearity and Resolution of Semiconductor Radiation Detectors
Author
Zulliger, H.R. ; Middleman, L.M. ; Aitken, D.W.
Author_Institution
Department of Physics and High Energy Physics Laboratory Stanford University, Stanford, California
Volume
16
Issue
1
fYear
1969
Firstpage
47
Lastpage
61
Abstract
The energy linearity for Si(Li) and Ge(Li) has been measured and compared with theory. Good agreement was obtained for x-ray attenuation factors ¿md < 100 . The region of the germanium absorption edge was investigated and found to exhibit larger nonlinearities than predicted by the theory. The discrepancy is believed to be due to inefficient charge collection near the detector window leading to excessive fluctuations in the trapped charge. Calculations of the line broadening due to trapping have been shown to agree qualitatively with experimental values for the silicon detector. These calculations do not take into account any position dependent variation of the trapping factor, and must therefore be considered as the best attainable values. The disagreement between theory and experiment for the line broadening in Ge(Li) is particularly evident. The ¿ seems to be independent of energy in Si to less than 0.2% and in Ge to within at least 2% . Finally, the Fano factor in Si was found to be 0.154 +0.1 -0.2.
Keywords
Charge carrier processes; Electromagnetic wave absorption; Electron mobility; Electron traps; Energy resolution; Gamma ray detection; Germanium; Linearity; Semiconductor radiation detectors; Silicon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1969.4325080
Filename
4325080
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