• DocumentCode
    789724
  • Title

    Radio-Frequency Heating of GaAs and SiC Photoconductive Switch for High-Power Applications

  • Author

    Gunda, Rahul ; Gleason, David S. ; Kelkar, Kapil ; Kirawanich, Phumin ; Nunnally, William C. ; Islam, Naz E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Missouri Univ., Columbia, MO
  • Volume
    34
  • Issue
    5
  • fYear
    2006
  • Firstpage
    1697
  • Lastpage
    1701
  • Abstract
    The response of a nonlinear opposed contact GaAs photoconductive switch, which is used in high-power microwave generation, was studied for high-power radio-frequency heating effects and compared with a linear-mode SiC switch. Current-controlled negative resistivity behavior was observed at elevated temperature in both cases. Better thermal conductivity and the absence of a heat sink result in a faster temperature increase and in local thermal carrier generation in SiC. Negative resistivity characteristics leading to unstable filamentation and thermal runaway are therefore more severe and occur at a lower bias in SiC as compared with a GaAs switch. To counter such effects, mechanisms to remove excess heat in switches in high-power application must be devised
  • Keywords
    III-V semiconductors; electrical resistivity; gallium arsenide; microwave generation; microwave switches; photoconducting switches; silicon compounds; thermal conductivity; wide band gap semiconductors; GaAs; SiC; current-controlled negative resistivity; heat sink; high-power microwave generation; photoconductive switch; radiofrequency heating; thermal carrier generation; thermal conductivity; thermal runaway; unstable filamentation; Contacts; Gallium arsenide; Heating; Microwave generation; Photoconductivity; Radio frequency; Silicon carbide; Switches; Temperature; Thermal conductivity; High-power microwaves (HPMs); photoconductive semiconductor switches (PCSSs); radio-frequency (RF) heating effects;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2006.876519
  • Filename
    1710028