Faraday rotation in quaternary CdMnCoTe thick films deposited on transparent quartz glass substrates

Author

Okada, Akira ; Ahn, Jin-Yong ; Inoue, Satoru ; Yamaguchi, Toshinao ; Imamura, Masaaki

Author_Institution

Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan

Volume

39

Issue

5

fYear

2003

Firstpage

3175

Lastpage

3177

Abstract

Faraday rotation θ_F at an optical wavelength of 635 nm is studied on quaternary CdMnCoTe thick films deposited on quartz glass substrates by molecular beam epitaxy. The magnitude of θ_F in the CdMnCoTe film is compared with that in CdMnTe film. It is shown that the Faraday rotation for Cd_0.43Mn_0.54Co_0.03Te film is approximately four times that for Cd_0.40Mn_0.60Te film. The value of θ_F in the Cd_0.43Mn_0.54Co_0.03Te film at 635 nm was -1.2° under a magnetic field of 5.8 kOe. The observed signal due to Faraday effect is shown for a 0.1-Hz alternating magnetic field with an amplitude of 5.8 kOe.

Keywords

Faraday effect; II-VI semiconductors; cadmium compounds; cobalt compounds; magnetic epitaxial layers; manganese compounds; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; semimagnetic semiconductors; 635 nm; Cd_0.43Mn_0.54Co_0.03Te; Faraday rotation; SiO₂; molecular beam epitaxy; optical wavelength; quaternary CdMnCoTe thick films; transparent quartz glass substrates; Faraday effect; Ferrimagnetic films; Glass; Magnetic films; Molecular beam epitaxial growth; Optical films; Semiconductor films; Substrates; Tellurium; Thick films;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2003.816048

Filename

1233336