• DocumentCode
    790456
  • Title

    Effect of grain size on domain structure of thin nonoriented Si-Fe electrical sheets

  • Author

    Takezawa, M. ; Wada, Y. ; Yamasaki, J. ; Honda, T. ; Kaido, C.

  • Author_Institution
    Dept. of Appl. Sci. for Integrated Syst. Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
  • Volume
    39
  • Issue
    5
  • fYear
    2003
  • Firstpage
    3208
  • Lastpage
    3210
  • Abstract
    Domain configuration of the nonoriented Si-Fe electrical sheets with different grain size was observed decreasing their sheet thickness by using the Kerr effect. It was found that the nonoriented sheet needs multiple grains in the sheet thickness direction to eliminate the normal magnetization component in the flux closing structure causing excessive eddy current loss.
  • Keywords
    eddy current losses; ferromagnetic materials; grain size; iron alloys; magnetic domains; magnetic flux; magnetisation; silicon alloys; Kerr effect; Si-Fe; anomaly factor; domain structure; eddy current loss; flux closing structure; grain size; hysteresis loss; normal magnetization component elimination; sheet thickness; thin nonoriented Si-Fe electrical sheets; Costs; Eddy currents; Grain size; Iron; Kerr effect; Magnetic domains; Magnetic force microscopy; Magnetization; Resistance heating; Steel;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2003.816149
  • Filename
    1233347
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=790456