DocumentCode
791461
Title
Yoke flux reversal time in thin-film write heads
Author
Klaassen, K.B. ; van Peppen, J.C.L.
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
Volume
31
Issue
6
fYear
1995
fDate
11/1/1995 12:00:00 AM
Firstpage
2657
Lastpage
2659
Abstract
A simple method is described for measuring the time dependency of the magnetization reversal process in the yoke of thin-film inductive write heads. Measurement results are given for an experimental head, showing close agreement with earlier published, calculated data
Keywords
magnetic heads; magnetic thin film devices; magnetisation reversal; magnetization reversal; thin-film inductive write heads; yoke flux reversal time; Conducting materials; Driver circuits; Eddy currents; Frequency; Hard disks; Magnetic heads; Magnetization reversal; Saturation magnetization; Time measurement; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.490083
Filename
490083
Link To Document