DocumentCode
792338
Title
Selective formation of dielectric films on vertical surface of substrate for photonic integrated circuits
Author
Tamura, Shuichi ; Baba, Toshihiko ; Kokubun, Yasuo
Author_Institution
Div. of Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
Volume
28
Issue
7
fYear
1992
fDate
7/1/1992 12:00:00 AM
Firstpage
1727
Lastpage
1731
Abstract
The authors investigated the deposition conditions of the bias-sputtering technique to form some sophisticated thin-film geometries for photonic integrated circuits, and they successfully formed a dielectric film selectively on a vertical surface of a substrate. The deposition rate on the vertical surface increases with the increases of the bias RF power because of the resputtering effect from the bottom surface. When the etching rate by the bias RF power is balanced with the deposition rate on the horizontal surface, one can form a film selectively on the vertical surface. This technique can be applied to the AR coating of DFB lasers and the formation of a multilayer filter on the vertical surface of a waveguide
Keywords
antireflection coatings; dielectric thin films; distributed feedback lasers; integrated optics; optical films; sputtered coatings; antireflection coating; bias radiofrequency power; bias-sputtering technique; bottom surface; deposition rate; dielectric films; distributed feedback lasers; etching rate; horizontal surface; multilayer filter; photonic integrated circuits; resputtering effect; substrate; thin-film geometries; vertical surface; waveguide; Coatings; Dielectric films; Dielectric substrates; Dielectric thin films; Etching; Geometry; Photonic integrated circuits; Radio frequency; Sputtering; Thin film circuits;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.142560
Filename
142560
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