• DocumentCode
    793312
  • Title

    Magnetic and Magneto-Optical Properties of Fe/Si Multilayered Films

  • Author

    Yazawa, M. ; Iwata, S. ; Uchiyama, S.

  • Author_Institution
    Nagoya Universtiy.
  • Volume
    4
  • Issue
    7
  • fYear
    1989
  • fDate
    7/1/1989 12:00:00 AM
  • Firstpage
    437
  • Lastpage
    445
  • Abstract
    The magnetic and magneto-optical properties of Fe/Si multilayered films prepared by electron beam evaporation have been studied. X-ray diffraction studies verified that films with periods of more than 16 A have an artificial period, and both Fe and Si monolayers were confirmed to have amorphous structures. Polar Kerr rotation angles were very small at short wavelengths, and were largest in the range 700 to 1000 nm. When the Fe monolayer thickness is constant, the wavelength of the maximum Kerr rotation angle shifts to longer wavelengths with increasing Si monolayer thickness. The Kerr rotation angle and reflectivity calculated from the optical constants of Fe and Si, taking optical interference into account, do not agree with experimental results. But if it is assumed that an FeSi alloy layer exists at the Fe-Si interfaces, the agreement between calculations and experiments is improved.
  • Keywords
    Amorphous magnetic materials; Amorphous materials; Electron beams; Iron; Magnetic films; Magnetic properties; Optical films; Reflectivity; Semiconductor films; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1989.4564025
  • Filename
    4564025