DocumentCode
795834
Title
Linearisation of MOS resistors using capacitive gate voltage averaging
Author
Ramírez-Angulo, J. ; Sawant, M.S. ; Carvajal, R.G. ; López-Martín, A.
Author_Institution
Klispch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
Volume
41
Issue
9
fYear
2005
fDate
4/28/2005 12:00:00 AM
Firstpage
511
Lastpage
512
Abstract
A compact implementation of a scheme to improve linearity of MOS resistors is introduced. It is based on capacitive gate voltage averaging in conjunction with large resistive biasing elements implemented using MOS transistors operating in subthreshold. Experimental results from a test chip in 0.5 μm CMOS technology are shown that verify the proposed technique.
Keywords
CMOS integrated circuits; MIS devices; linearisation techniques; resistors; 0.5 micron; CMOS technology; MOS resistors; MOS transistor; capacitive gate voltage averaging; resistive biasing elements;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20050565
Filename
1426553
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