DocumentCode
795965
Title
Gamma Ray Detectors Made from High Purity Germanium
Author
Baertsch, R.D. ; Hall, R.N.
Author_Institution
General Electric Research and Development Center Schenectady, New York
Volume
17
Issue
3
fYear
1970
fDate
6/1/1970 12:00:00 AM
Firstpage
235
Lastpage
240
Abstract
A solution regrowth technique for growing P+ and N+ contacts on high purity germanium is described. Copper contamination of the high purity germanium is minimized by using KCN to remove copper from the surface of the germanium and by the gettering ability of molten indium in contact with the germanium. Diodes with leakage currents as low as 3 Ã 10-11 amp for 2000 volts applied to a fully depleted 4 mm thick detector have been fabricated. Preliminary measurements show that the resolution obtained with these diodes is comparable to the best Li drifted germanium detectors at 60 keV and 122 keV. Diodes have been warmed to room temperature as many as five times with no degradation in resolution.
Keywords
Copper; Diodes; Gamma ray detectors; Germanium; Gettering; Indium; Leak detection; Leakage current; Pollution measurement; Surface contamination;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1970.4325695
Filename
4325695
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