• DocumentCode
    795965
  • Title

    Gamma Ray Detectors Made from High Purity Germanium

  • Author

    Baertsch, R.D. ; Hall, R.N.

  • Author_Institution
    General Electric Research and Development Center Schenectady, New York
  • Volume
    17
  • Issue
    3
  • fYear
    1970
  • fDate
    6/1/1970 12:00:00 AM
  • Firstpage
    235
  • Lastpage
    240
  • Abstract
    A solution regrowth technique for growing P+ and N+ contacts on high purity germanium is described. Copper contamination of the high purity germanium is minimized by using KCN to remove copper from the surface of the germanium and by the gettering ability of molten indium in contact with the germanium. Diodes with leakage currents as low as 3 × 10-11 amp for 2000 volts applied to a fully depleted 4 mm thick detector have been fabricated. Preliminary measurements show that the resolution obtained with these diodes is comparable to the best Li drifted germanium detectors at 60 keV and 122 keV. Diodes have been warmed to room temperature as many as five times with no degradation in resolution.
  • Keywords
    Copper; Diodes; Gamma ray detectors; Germanium; Gettering; Indium; Leak detection; Leakage current; Pollution measurement; Surface contamination;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1970.4325695
  • Filename
    4325695