STM/AFM/MFM Characterization of Electronic and Magnetic Materials and Their Applications

This review presents characterizations of electronic materials and a magnetic recording medium using a scanning tunneling microscope (STM), an atomic force microscope (ATM) and a magnetic force microscope (MFM). The experimental results of the characterizations are as follows. An STM was used to observe a Si surface with atomic or nanometer resolution. An AFT was also used to observe the surface of insulators such as magnetic materials. A MFM was used to observe the stray magnetic field distributions at magnetooptic disk surface. In addition, atomic scale modification using a STM for electric field evaporation is described and shown to be a promising technology for use in future high-density recording.