• DocumentCode
    80318
  • Title

    Parametric History Analysis for Material Properties Using Finite Elements and Adaptive Perturbations

  • Author

    Gunel, Serkan ; Zoral, Emine Yesim

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Dokuz Eylul Univ., İzmir, Turkey
  • Volume
    63
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    90
  • Lastpage
    98
  • Abstract
    When microwave structures are perturbed by the presence of an external material, the resonant frequencies shift depending on the location and the electrical properties of the perturber. Such a shift can be used to determine the properties of the perturber, as well as variations with respect to an additional parameter such as the temperature. The finite-element method can be used to study these effects numerically. When the electrical parameters of the perturber are changed in an attempt to fine tuning or optimization of the structure, the numerical analysis requires resulting finite-element equations to be solved for each value of the perturbation parameter, repetitively. In this paper, we present the step-by-step eigenvalue perturbation technique to reduce the computational cost of such analysis significantly. The arising generalized eigenvalue problem is solved by successive iterations of eigenvalue perturbations. The step size of the sequential perturbations is chosen adaptively such that corresponding generalized eigenvalue problem is valid physically. The technique is especially effective when used with finite-element methods due to the characteristic symmetric structure of the matrices of the associated generalized eigenvalue problem.
  • Keywords
    eigenvalues and eigenfunctions; finite element analysis; matrix algebra; microwave materials; perturbation techniques; adaptive perturbation; computational cost reduction; eigenvalue perturbation iteration; eigenvalue perturbation technique; electrical property; fine tuning; finite element method; finite-element equation; material property; matrix symmetric structure; microwave structure; numerical analysis; parametric history analysis; perturbation parameter; resonant frequency; Accuracy; Computational efficiency; Eigenvalues and eigenfunctions; Finite element analysis; History; Mathematical model; Sparse matrices; Cavity perturbation; dielectric ring resonator; eigenvalues and eigenfunctions; fast parametric sweeps; finite elements; parametric history analysis; perturbation methods; sensitivity;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2014.2374599
  • Filename
    6978002