DocumentCode
803311
Title
Modeling Lateral Parasitic Transistors in Smart Power ICs
Author
Oehmen, Joerg ; Olbrich, Markus ; Hedrich, Lars ; Barke, Erich
Author_Institution
Inst. of Microelectron. Syst., Hannover Univ.
Volume
6
Issue
3
fYear
2006
Firstpage
408
Lastpage
420
Abstract
Negative voltages in power stages of junction-isolated Smart Power ICs turn on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. In order to indicate inadmissible substrate currents and to evaluate protection measures, these parasitic transistors have to be included into a postlayout simulation. A methodology has been developed for automatically generating Verilog-A models for these parasites from layout data. These models account for an inhomogeneous current flow and high electron densities in the substrate. A reasonable tradeoff between convergence behavior and accuracy of the model has been found
Keywords
bipolar transistors; electron density; power integrated circuits; semiconductor device models; Verilog-A models; high electron densities; lateral parasitic transistors; minority carriers; parasitic bipolar transistors; power system simulation; semiconductor device modeling; smart power integrated circuits; substrate currents; Bipolar transistors; Doping; Electrons; Power integrated circuits; Power system modeling; Protection; Radiative recombination; Spontaneous emission; Substrates; Voltage; Bipolar transistors; nonlinearities; numerical stability; power system simulation; semiconductor device modeling;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2006.881506
Filename
1717490
Link To Document