• DocumentCode
    803311
  • Title

    Modeling Lateral Parasitic Transistors in Smart Power ICs

  • Author

    Oehmen, Joerg ; Olbrich, Markus ; Hedrich, Lars ; Barke, Erich

  • Author_Institution
    Inst. of Microelectron. Syst., Hannover Univ.
  • Volume
    6
  • Issue
    3
  • fYear
    2006
  • Firstpage
    408
  • Lastpage
    420
  • Abstract
    Negative voltages in power stages of junction-isolated Smart Power ICs turn on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. In order to indicate inadmissible substrate currents and to evaluate protection measures, these parasitic transistors have to be included into a postlayout simulation. A methodology has been developed for automatically generating Verilog-A models for these parasites from layout data. These models account for an inhomogeneous current flow and high electron densities in the substrate. A reasonable tradeoff between convergence behavior and accuracy of the model has been found
  • Keywords
    bipolar transistors; electron density; power integrated circuits; semiconductor device models; Verilog-A models; high electron densities; lateral parasitic transistors; minority carriers; parasitic bipolar transistors; power system simulation; semiconductor device modeling; smart power integrated circuits; substrate currents; Bipolar transistors; Doping; Electrons; Power integrated circuits; Power system modeling; Protection; Radiative recombination; Spontaneous emission; Substrates; Voltage; Bipolar transistors; nonlinearities; numerical stability; power system simulation; semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2006.881506
  • Filename
    1717490