• DocumentCode
    803421
  • Title

    High-accuracy finite-difference equations for dielectric waveguide analysis I: uniform regions and dielectric interfaces

  • Author

    Hadley, G. Ronald

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    20
  • Issue
    7
  • fYear
    2002
  • fDate
    7/1/2002 12:00:00 AM
  • Firstpage
    1210
  • Lastpage
    1218
  • Abstract
    A methodology is presented that allows the derivation of low-truncation-error finite-difference representations or the two-dimensional Helmholtz equation, specific to waveguide analysis. This methodology is derived from the formal infinite series solution involving Bessel functions and sines and cosines. The resulting finite-difference equations are valid everywhere except at dielectric corners, and are highly accurate (from fourth to sixth order, depending on the type of grid employed). None the less, they utilize only a nine-point stencil, and thus lead to only minor increases in numerical effort compared with the standard Crank-Nicolson equations.
  • Keywords
    Bessel functions; Helmholtz equations; eigenvalues and eigenfunctions; electromagnetic field theory; electromagnetic wave propagation; finite difference methods; optical waveguide theory; 2D Helmholtz equation; Bessel functions; dielectric corners; dielectric interfaces; dielectric waveguide analysis; finite-difference equations; formal infinite series solution; high-accuracy finite-difference equations; low-truncation-error finite-difference representations; nine-point stencil; optical waveguide theory; standard Crank-Nicolson equations; two-dimensional Helmholtz equation; uniform regions; waveguide analysis; Circuits; Dielectric constant; Difference equations; Finite difference methods; Finite element methods; Finite wordlength effects; Laser beams; Transmission line matrix methods; US Department of Energy; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2002.800361
  • Filename
    1026393