• DocumentCode
    804356
  • Title

    Far-field pattern determination from the near-field amplitude on two surfaces

  • Author

    Bucci, Ovidio M. ; Elia, Giuseppe D. ; Leone, Giovanni ; Pierri, Rocco

  • Author_Institution
    Dipartimento di Elettronica, Naples Univ., Italy
  • Volume
    38
  • Issue
    11
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    1772
  • Lastpage
    1779
  • Abstract
    The possibility of determining the far field of radiating systems by measuring only the near-field amplitude is investigated. The main difficulties of the problem are examined in some detail and a new near-field/far-field transformation technique is developed, based on the measurement of the near-field amplitude over two surfaces surrounding the antenna under test. The accuracy of the far-field reconstruction results are related both to the distance between such surfaces and to some a priori information concerning the near-field phase and/or the radiating system. The information on the radiating system allows relaxation of the need for any information on the near-field phase provided that the distance between the measurement surfaces is high enough. Conversely, the knowledge of a more or less corrupted near-field phase allows reduction of such distances without affecting the accuracy of the far-field reconstruction. Numerical examples validating the effectiveness of the developed algorithm are provided for the planar scanning case
  • Keywords
    antenna radiation patterns; antenna under test; far-field pattern; far-field reconstruction; measurement surfaces; near-field amplitude; near-field phase; near-field/far-field transformation technique; numerical results; planar scanning case; radiating systems; Amplitude estimation; Antenna measurements; Electric variables measurement; Frequency measurement; Helium; Particle measurements; Phase estimation; Phase measurement; Surface reconstruction; System testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.102738
  • Filename
    102738