• DocumentCode
    804515
  • Title

    Radiation and scattering from structures involving finite-size dielectric regions

  • Author

    Rubin, Barry J. ; Daijavad, Shahrokh

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktwon Heights, NY, USA
  • Volume
    38
  • Issue
    11
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    1863
  • Lastpage
    1873
  • Abstract
    A full-wave approach is presented for calculating the scattered fields produced by structures that involve finite-size dielectric regions. The dielectric is first approximated by an array of interlocking thin-wall sections; the electric field boundary conditions are then applied through the use of appropriate surface impedances. Rooftop basis functions, chosen to represent the surface current, are appropriately placed on the thin-wall sections in such a way as to accurately represent the polarization current while preventing fictitious charge within the dielectric. Rooftop currents are also used to represent the current on any conductor that may be present. The matrix elements are calculated, depending upon the distance between the source and field locations, through a scheme that employs Taylor series expansions and point source approximations. The technique is applied to scattering from dielectric cubes and composite dielectric-conductor structures, and to radiation from microstrip structures. Numerical convergence and agreement with the literature are demonstrated
  • Keywords
    dielectric materials; electric impedance; electromagnetic field theory; electromagnetic wave scattering; Taylor series expansions; composite dielectric-conductor structures; dielectric cubes; distance; electric field boundary conditions; finite-size dielectric regions; full-wave approach; matrix elements; microstrip structures; numerical convergence; point source approximations; polarization current; radiation; rooftop basis functions; rooftop currents; scattered fields; surface current; surface impedances; Boundary conditions; Conductors; Dielectrics; Microstrip; Polarization; Scattering; Surface impedance; Taylor series; Thin wall structures; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.102752
  • Filename
    102752