• DocumentCode
    804765
  • Title

    System for Measuring Thin-Film Permeability by Using a Parallel Line

  • Author

    Kimura, T. ; Mitera, M. ; Terasaka, M. ; Nose, M. ; Matsumoto, F. ; Matsuki, H. ; Fujimori, H. ; Masumoto, T.

  • Author_Institution
    Mitsubishi Heavy Industries, Ltd.
  • Volume
    9
  • Issue
    3
  • fYear
    1994
  • Firstpage
    16
  • Lastpage
    22
  • Abstract
    A method of measuring the permeability of soft magnetic films at high frequencies was investigated. The main components of this system are a network anlyzer and a parallel line. We attempted to discover why the value of the permeability given by the parallel line method is smaller than that given by the coil impedance method. We found that the leakage of field energy outside the line must be considered in evaluating the permeability correctly. The parameter ¿ was introduced to describe the leakage of field energy. We then measured the value of the permeability by the parallel line method (10 MHz to 500 MHz), and the value obtained agreed well with measurements using a figure-8 type permeameter (1 MHz to 100 MHz). The parallel line was 15 mm long, 11.3 mm wide and 1.5 mm deep.
  • Keywords
    Coils; Frequency measurement; Impedance measurement; Magnetic field measurement; Magnetic films; Magnetic materials; Nose; Permeability measurement; Solenoids; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1994.4565854
  • Filename
    4565854