DocumentCode
804765
Title
System for Measuring Thin-Film Permeability by Using a Parallel Line
Author
Kimura, T. ; Mitera, M. ; Terasaka, M. ; Nose, M. ; Matsumoto, F. ; Matsuki, H. ; Fujimori, H. ; Masumoto, T.
Author_Institution
Mitsubishi Heavy Industries, Ltd.
Volume
9
Issue
3
fYear
1994
Firstpage
16
Lastpage
22
Abstract
A method of measuring the permeability of soft magnetic films at high frequencies was investigated. The main components of this system are a network anlyzer and a parallel line. We attempted to discover why the value of the permeability given by the parallel line method is smaller than that given by the coil impedance method. We found that the leakage of field energy outside the line must be considered in evaluating the permeability correctly. The parameter ¿ was introduced to describe the leakage of field energy. We then measured the value of the permeability by the parallel line method (10 MHz to 500 MHz), and the value obtained agreed well with measurements using a figure-8 type permeameter (1 MHz to 100 MHz). The parallel line was 15 mm long, 11.3 mm wide and 1.5 mm deep.
Keywords
Coils; Frequency measurement; Impedance measurement; Magnetic field measurement; Magnetic films; Magnetic materials; Nose; Permeability measurement; Solenoids; Transistors;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1994.4565854
Filename
4565854
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