DocumentCode
805033
Title
What limits the maximum output power of long-wavelength AlGaInAs/InP laser diodes?
Author
Piprek, Joachim ; White, J. Kenton ; SpringThorpe, Anthony J.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume
38
Issue
9
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
1253
Lastpage
1259
Abstract
We analyze the high-temperature continuous-wave performance of 1.3-μm AlGaInAs/InP laser diodes grown by digital alloy molecular-beam epitaxy. Commercial laser software is utilized that self-consistently combines quantum-well bandstructure and gain calculations with two-dimensional simulations of carrier transport, wave guiding, and heat flow. Excellent agreement between simulation and measurements is obtained by careful adjustment of material parameters in the model. Joule heating is shown to be the main heat source; quantum-well recombination heat is almost compensated for by Thomson cooling. Auger recombination is the main carrier loss mechanism at lower injection current. Vertical electron escape into the p-doped InP cladding dominates at higher current and causes the thermal power roll-off. Self-heating and optical gain reduction are the triggering mechanisms behind the leakage escalation. Laser design variation is shown to allow for a significant increase in the maximum output power at high temperatures.
Keywords
Auger effect; III-V semiconductors; aluminium compounds; carrier mobility; gallium arsenide; indium compounds; laser transitions; molecular beam epitaxial growth; quantum well lasers; semiconductor device models; thermo-optical effects; waveguide lasers; 1.3 micron; AlGaInAs-InP; Auger recombination; InP; Joule heating; P-doped InP cladding; Thomson cooling; carrier transport; digital alloy molecular-beam epitaxy; gain calculations; heat flow; high temperatures; high-temperature continuous-wave performance; injection current; laser software; leakage escalation; long-wavelength AlGaInAs/InP laser diodes; main carrier loss mechanism; main heat source; material parameters; maximum output power; optical gain reduction; quantum-well bandstructure; quantum-well recombination heat; thermal power roll-off; triggering mechanisms; two-dimensional simulations; vertical electron escape; wave guiding; Digital alloys; Diode lasers; Indium phosphide; Molecular beam epitaxial growth; Performance analysis; Power generation; Quantum well lasers; Radiative recombination; Spontaneous emission; Trigeneration;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2002.802441
Filename
1027769
Link To Document