• DocumentCode
    805150
  • Title

    Coherent optical frequency domain reflectometry for a long single-mode optical fiber using a coherent lightwave source and an external phase modulator

  • Author

    Tsuji, K. ; Shimizu, K. ; Horiguchi, T. ; Koyamada, Y.

  • Author_Institution
    NTT Access Network Syst. Labs., Ibaraki, Japan
  • Volume
    7
  • Issue
    7
  • fYear
    1995
  • fDate
    7/1/1995 12:00:00 AM
  • Firstpage
    804
  • Lastpage
    806
  • Abstract
    Coherent optical frequency domain reflectometry (C-OFDR) is demonstrated for a long single-mode optical fiber at a wavelength of 1.55 μm by using a highly coherent lightwave source and an electrooptical (EO) external phase modulator. Rayleigh backscattering and Fresnel reflection from a 16.4-km optical fiber are observed when the modulation frequency is swept from 4 GHz to 8 GHz for 40 ms. The insertion of an optical fiber delay line in a probe lightwave path makes it possible to distinguish the Rayleigh backscattering profile due to the first-order modulation sideband in the phase-modulated lightwave from those due to the higher order sidebands. A spatial resolution of better than 100 m is achieved for two neighboring Fresnel reflectors located near the far end of the test fiber.
  • Keywords
    Rayleigh scattering; backscatter; electro-optical modulation; light coherence; light scattering; optical fibre testing; optical time-domain reflectometry; phase modulation; 1.55 mum; 16.4 km; 4 to 8 GHz; 40 ms; Fresnel reflection; Rayleigh backscattering; Rayleigh backscattering profile; coherent lightwave source; coherent optical frequency domain reflectometry; electrooptical external phase modulator; external phase modulator; far end; first-order modulation sideband; higher order sidebands; highly coherent lightwave source; long single-mode optical fiber; modulation frequency; neighboring Fresnel reflectors; optical fiber delay line insertion; phase-modulated lightwave; probe lightwave path; spatial resolution; test fiber; Backscatter; Delay lines; Electrooptic modulators; Frequency domain analysis; Frequency modulation; Fresnel reflection; Optical fibers; Optical modulation; Phase modulation; Reflectometry;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.393212
  • Filename
    393212