• DocumentCode
    80554
  • Title

    Degradation Modeling and Maintenance Decisions Based on Bayesian Belief Networks

  • Author

    Xinghui Zhang ; Jianshe Kang ; Tongdan Jin

  • Author_Institution
    Mech. Eng. Coll., Shijiazhuang, China
  • Volume
    63
  • Issue
    2
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    620
  • Lastpage
    633
  • Abstract
    A variety of data-driven models focused on remaining lifetime prediction have been developed under condition-based monitoring framework. These models either assume an analytical formula for the underlying degradation path is known, or the number of degradation states could be determined subjectively. This paper proposes an adaptive discrete-state model to estimate system remaining lifetime based on Bayesian Belief Network (BBN) theory. The model consists of three steps: degradation state identification, degradation state characterization, and remaining life prediction. Our approach does not require an explicit distribution function to characterize the fault evolutionary process. Because the BBN model leverages the validity measures to determine the optimum state number, it avoids the state identification errors under limited feature data. The performance of the BBN model is validated and verified by actual and simulated bearing life data. Numerical examples show that the Bayesian degradation model outperforms a time-based maintenance policy both in cost and reliability.
  • Keywords
    belief networks; condition monitoring; machine bearings; mechanical engineering computing; BBN model; Bayesian belief networks; adaptive discrete-state model; condition-based monitoring framework; data-driven models; degradation state characterization; degradation state identification; fault evolutionary process; real bearing fault data; remaining life prediction; Bayes methods; Data models; Degradation; Hidden Markov models; Indexes; Maintenance engineering; Predictive models; Bayesian network; condition-based monitoring; feature extraction; remaining useful lifetime; wavelet decomposition;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2014.2315956
  • Filename
    6798765