• DocumentCode
    806710
  • Title

    Radiation Damage Effects by Electrons, Protons, and Neutrons in Si(Li) Detectors

  • Author

    Liu, Y.M. ; Coleman, J.A.

  • Author_Institution
    Institute for Applied Technology National Bureau of Standards Washington, D. C. 20234
  • Volume
    19
  • Issue
    3
  • fYear
    1972
  • fDate
    6/1/1972 12:00:00 AM
  • Firstpage
    346
  • Lastpage
    352
  • Abstract
    The degradation of performance of lithium-compensated silicon nuclear particle detectors induced by irradiation at room temperature with 0.6-MeV and 1.5-MeV electrons, l.9-MeV protons, and "fast" neutrons from a plutonium-beryllium [Pu-Be] source has been investigated. In general with increasing fluence, the irradiations produced an increase of detector leakage current, noise, capacitance, and a degradation in the performance of the detector as a charged-particle energy spectrometer. Following the irradiations, annealing effects were observed when the detectors were reverse-biased at their recommended operating voltages. Upon removal of bias, a continuous degradation of detector performance characteristics occurred. Detectors which had been damaged by electrons and protons exhibited a stabilization in their characteristics within two weeks after irradiation, whereas detectors damaged by neutrons had a continuous degradation of performance over a period of several months.
  • Keywords
    Capacitance; Degradation; Electrons; Leak detection; Leakage current; Neutrons; Protons; Radiation detectors; Silicon; Temperature;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326748
  • Filename
    4326748