DocumentCode

807706

Title

Permanent and Transient Radiation Effects in Baritt Microwave Oscillators

Author

Chaffin, R.J.

Author_Institution

Sandia Laboratories Albuquerque, New Mexico

Volume

19

Issue

6

fYear

1972

Firstpage

325

Lastpage

327

Keywords

Acoustical engineering; Electron traps; Gunn devices; Microwave devices; Microwave oscillators; Neodymium; Neutrons; Radiation effects; Silicon; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1972.4326852

Filename

4326852