DocumentCode
811523
Title
60 GHz Single-Chip Front-End MMICs and Systems for Multi-Gb/s Wireless Communication
Author
Gunnarsson, Sten E. ; Rnfelt, Camilla ; Zirath, Herbert ; Kozhuharov, Rumen ; Kuylenstierna, Dan ; Fager, Christian ; Ferndahl, Mattias ; Hansson, Bertil ; Alping, Arne ; Hallbjörner, Paul
Author_Institution
Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Goteborg
Volume
42
Issue
5
fYear
2007
fDate
5/1/2007 12:00:00 AM
Firstpage
1143
Lastpage
1157
Abstract
Single-chip 60 GHz transmitter (TX) and receiver (RX) MMICs have been designed and characterized in a 0.15mum (fT~ 120 GHz/f MAX> 200 GHz) GaAs mHEMT MMIC process. This paper describes the second generation of single-chip TX and RX MMICs together with work on packaging (e.g., flip-chip) and system measurements. Compared to the first generation of the designs in a commercial pHEMT technology, the MMICs presented in this paper show the same high level of integration but occupy smaller chip area and have higher gain and output power at only half the DC power consumption. The system operates with a LO signal in the range of 7-8 GHz. This LO signal is multiplied in an integrated multiply-by-eight (X8) LO multiplier chain, resulting in an IF center frequency of 2.5 GHz. Packaging and interconnects are discussed and as an alternative to wire bonding, flip-chip assembly tests are presented and discussed. System measurements are also described where bit error rate (BER) and eye diagrams are measured when the presented TX and RX MMICs transmits and receives a modulated signal. A data rate of 1.5 Gb/s with simple ASK modulation was achieved, restricted by the measurement setup rather than the TX and RX MMICs. These tests indicate that the presented MMICs are especially well suited for transmission and reception of wireless signals at data rates of several Gb/s
Keywords
HEMT integrated circuits; III-V semiconductors; MMIC oscillators; amplitude shift keying; error statistics; flip-chip devices; gallium arsenide; integrated circuit interconnections; integrated circuit packaging; radio receivers; radio transmitters; 0.15 micron; 1.5 Gbit/s; 60 GHz; 7 to 8 GHz; ASK modulation; BER; GaAs; LO signal; RX MMIC; TX MMIC; bit error rate; eye diagrams; flip-chip assembly tests; front-end MMIC; pHEMT technology; receiver MMIC; transmitter MMIC; wire bonding; wireless communication; wireless signals; Bit error rate; Gallium arsenide; MMICs; Packaging; Power generation; Semiconductor device measurement; Testing; Transmitters; Wireless communication; mHEMTs; 60 GHz; GaAs; MMIC; RFIC; RX; TX; V-band; flip-chip; highly integrated; image rejection; mHEMT; multi-functional; packaging; receiver; single-chip; transmitter;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2007.894824
Filename
4160072
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