Design and screening of highly reliable 980-nm pump lasers

Author

Ghislotti, Giorgio ; Fantini, Fausto

Author_Institution

Corning Opt. Technol. Italia, Milan, Italy

Volume

2

Issue

2

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

26

Lastpage

29

Abstract

Presents a design and screening approach that can be adopted to improve reliability of high-power 980-nm semiconductor lasers. Flared-ridge waveguide chips were realized on GRIN-SCH single-quantum-well structures. Without any screening, flared devices, thanks to the reduced peak power and current density, showed a 20% reduction in failure rate with respect to devices with straight waveguide. By adopting extended screening criteria, a more reliable population was selected, showing a reduction by a factor of two in the failure rate extrapolated at standard operating conditions.

Keywords

current density; failure analysis; gradient index optics; quantum well lasers; semiconductor device reliability; 980 nm; GRIN-SCH single-quantum-well structures; current density; design approach; extended screening criteria; failure rate; flared-ridge waveguide chips; peak power; reliability; semiconductor lasers; standard operating conditions; Laser excitation; Optical design; Optical filters; Optical pumping; Optical waveguides; Power system reliability; Pump lasers; Semiconductor device reliability; Semiconductor lasers; Waveguide lasers;

fLanguage

English

Journal_Title

Device and Materials Reliability, IEEE Transactions on

Publisher

ieee

ISSN

1530-4388

Type

jour

DOI

10.1109/TDMR.2002.802026

Filename

1030872