• DocumentCode
    811954
  • Title

    High-speed single-quantum-well InGaAs/GaAs laser design and experiment

  • Author

    Nagarajan, Radhakrishnan ; Fukushima, Tetsuya ; Bowers, John E. ; Geels, R.S. ; Coldren, Larry A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
  • Volume
    38
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    2689
  • Lastpage
    2690
  • Abstract
    Summary form only given. The authors report damping factors an order of magnitude lower than previously reported for SQW lasers. They also report bandwidths of 15 GHz obtained in SQW (single quantum well) lasers as a result of proper design of the quantum-well structure. The laser samples were grown on (100) n-type GaAs by molecular beam epitaxy (MBE). The SQW lasers had a minimum broad area threshold of 125 A/cm2. A self-aligned technique was used to fabricate the narrow-ridge waveguide lasers. The ridges were dry-etched using Cl2 . A model was developed that quantitatively explains the large enhancement in the dynamic response in the SQW lasers compared to those reported previously. This leads to an optimal design of quantum-well lasers for large-modulation bandwidths
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; molecular beam epitaxial growth; optical waveguides; semiconductor growth; semiconductor junction lasers; (100) substrate; 15 GHz; Cl2 dry etching; GaAs; InGaAs-GaAs; bandwidths; damping factors; dynamic response; high speed single quantum well lasers; large-modulation bandwidths; minimum broad area threshold; model; molecular beam epitaxy; narrow-ridge waveguide lasers; optimal design; self-aligned technique; Bandwidth; Damping; Gallium arsenide; Indium gallium arsenide; Laser modes; Molecular beam epitaxial growth; Optical design; Quantum well lasers; Semiconductor process modeling; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.158697
  • Filename
    158697